发明名称 Thin film transistor substrate
摘要 A thin film transistor substrate includes a gate electrode disposed on a substrate; a semiconductor layer disposed on the substrate that partially overlaps the gate electrode and includes an oxide semiconductor material; and a source electrode and a drain electrode disposed on the semiconductor layer, where the drain electrode is spaced apart from the source electrode. The source electrode and the drain electrode each include a barrier layer and a main wiring layer, the a main wiring layer is disposed on the barrier layer, and the barrier layer includes a first metal layer disposed on the semiconductor layer, and a second metal layer disposed on the first metal layer.
申请公布号 US9502579(B2) 申请公布日期 2016.11.22
申请号 US201514717734 申请日期 2015.05.20
申请人 SAMSUNG DISPLAY CO., LTD. 发明人 Kim Bong-Kyun;Yoon Seung-Ho;Choi Shin-Il
分类号 H01L29/12;H01L29/786;H01L29/417;H01L27/12;H01L23/532;H01L29/66 主分类号 H01L29/12
代理机构 F. Chau & Associates, LLC 代理人 F. Chau & Associates, LLC
主权项 1. A thin film transistor substrate, comprising: a gate electrode disposed on a substrate; a semiconductor layer disposed on the substrate that partially overlaps the gate electrode and includes an oxide semiconductor; a source electrode and a drain electrode disposed on the semiconductor layer, wherein the drain electrode is spaced apart from the source electrode; and a capping layer disposed on the main wiring layer and that includes a transparent conductive oxide, wherein the source electrode and the drain electrode each include a barrier layer and a main wiring layer disposed on the barrier layer, and wherein the barrier layer includes a first metal layer disposed on the semiconductor layer and a second metal layer disposed on the first metal layer.
地址 Yongin, Gyeonggi-Do KR