发明名称 ION ETCHING
摘要 Etching masks for ion etching which consist of a material which has an etching velocity which is independent of the angle of incidence of the etching ion beam are of advantage in particular when etching deep structures ( > 1 mu m) in a substrate of a material having an etching velocity which depends on the angle of incidence of the ion beam. Material of the etching mask: titanium.
申请公布号 GB1414029(A) 申请公布日期 1975.11.12
申请号 GB19730054719 申请日期 1973.11.26
申请人 PHILIPS ELECTRONIC ASSOCIATED INDUSTRIES LTD 发明人
分类号 C23F4/00;G03F7/20;H01L21/00;H01L21/263;H01L21/302;H01L21/3065;H01L49/02 主分类号 C23F4/00
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