发明名称 SPHERICAL ABERRATION CORRECTION DEVICE FOR CHARGED PARTICLE BEAM ELECTROMAGNETIC LENS
摘要 The present invention addresses the problem that an electromagnetic lens for a charged particle beam exerts a positive spherical aberration, and that correcting this spherical aberration requires a complex combination of electromagnetic lenses. In the present invention, one among a circular aperture and an annular aperture is formed in an entry plate disposed on a charged particle beam entry side, the other among the circular aperture and the annular aperture is formed in a plate disposed on the exit side, and a voltage is applied between the entry plate and an exit plate. Then, an electric field formed in the annular aperture exerts divergence whereby the positive spherical aberration is canceled. The present invention allows the spherical aberration to be corrected with an extremely simple and readily achievable structure.
申请公布号 WO2016174891(A1) 申请公布日期 2016.11.03
申请号 WO2016JP53691 申请日期 2016.02.08
申请人 NATIONAL UNIVERSITY CORPORATION NAGOYA UNIVERSITY 发明人 KAWASAKI Tadahiro;TANJI Takayoshi;IKUTA Takashi
分类号 H01J37/153;H01J37/145 主分类号 H01J37/153
代理机构 代理人
主权项
地址