| 摘要 |
PURPOSE:To detect the abnormality of a program in real time without the influence upon the operation of a computer, by comparing an analytic pattern, which is taken out from an executing program, with an analytic pattern for comparison to detect the abnormality of the program. CONSTITUTION:An analytic pattern P1 from a computer 1 is selected for every program by an analytic pattern selecting circuit 7, and an analytic pattern PS is stored in a storage device 2 and is stored in a storage device 4 through a learing circuit 8 for the analytic pattern for comparison. An analytic pattern PR for comparison from the external is stored in the device 4 through a writing circuit 6 for the analytic pattern for comarison, and an analytic pattern Pi for comparison in every program is outputted from the device 4. Only the pattern P1 designated by a program selecting signal SLE is selected by a comparing circuit 3 for every analytic pattern and is compared with an analytic pattern PSO from the device 2 in the comparing circuit 3 by a comparison command CMP, thus detecting the abnormality of the program in real time. |
