发明名称 CREEP TESTING DEVICE
摘要 PURPOSE:To execute a test for elucidating a creep phenomenon of a sample in vacuum and at elevated temperatures, by providing a vacuum generating mechanism for evacuating a vacuum chamber, and a pressurizing mechanism and a heating mechanism to the sample. CONSTITUTION:A vacuum state is formed in a vacuum chamber 1 by operating a rotaty pump. Also, a sample 107 provided on the upper end face of a placed bar 106 is pressed by the lower end face of a pressure bar 105. Also, the upper ends of heaters are connected to the lower parts of electrode metallic fittings 51, 52, the electrode metallic fittings 51, 52 are electrically conducted, the heaters 71, 72 are heated, and the sample 107 is heated.
申请公布号 JPS5942429(A) 申请公布日期 1984.03.09
申请号 JP19820151686 申请日期 1982.09.02
申请人 FUJI INBATSUKU KK 发明人 TAMAI KICHIYA
分类号 G01N3/00;G01N3/18;(IPC1-7):01N3/18 主分类号 G01N3/00
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