Error-correction coding for hot-swapping semiconductor devices

摘要

A memory read operation is directed at a group of semiconductor devices from which a first semiconductor device has been removed. An error in data for the memory read operation is detected based on error-correction coding (ECC). The error is caused at least in part by the first semiconductor device having been removed. ECC is used to determine corrected data for the memory read operation.

主权项

1. A method of hot-swapping semiconductor devices for a memory module, the hot-swapping comprising removing a semiconductor device from the memory module and replacing the semiconductor device with another semiconductor device while the memory module is powered up, the method comprising:
performing a memory read operation directed at a group of semiconductor devices mounted in respective sockets that couple the semiconductor devices to the memory module, wherein a first semiconductor device has been removed from the respective socket in which the first semiconductor device was mounted; based on error-correction coding (ECC), detecting an error in data for the memory read operation, the error being caused at least in part by the first semiconductor device having been removed; and using ECC to determine corrected data for the memory read operation.