发明名称 VERFAHREN ZUR HERSTELLUNG VON HALBLEITERVORRICHTUNGEN
摘要 This invention provides a method of fabricating semiconductor devices which permits high device density fabrication by providing an oxide layer (2) for isolation of the devices and selectively growing an epitaxial layer (21) as areas for the effective device regions to secure the least lateral isolation distance between the devices. The method also includes as an intermediate step the creation of a doped region 14 in the substrate by ion implantation. <IMAGE>
申请公布号 DE3903512(A1) 申请公布日期 1989.11.30
申请号 DE19893903512 申请日期 1989.02.06
申请人 SAMSUNG ELECTRONICS CO., LTD., SUWON, KR 发明人 KAHNG, CHANG-WON, SEOUL/SOUL, KR;MIN, SUNG-KI, INCHON, KR;YOUN, JONG-MIL, SEOUL/SOUL, KR
分类号 H01L21/76;H01L21/31;H01L21/74;H01L21/762;H01L21/8249;H01L27/06 主分类号 H01L21/76
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