发明名称 Method of producing semiconductor device.
摘要 <p>An impurity adsorption layer is formed on a substrate surface and solid-phase thermal diffusion is carried out to form source and drain regions of the metal-insulator-semiconductor field-effect-transistor having lightly doped drain structure or double doped drain structure. The thus formed impurity-doped region is ultrashallow, thereby producing fast and micro semiconductor devices.</p>
申请公布号 EP0417456(A2) 申请公布日期 1991.03.20
申请号 EP19900114789 申请日期 1990.08.01
申请人 SEIKO INSTRUMENTS INC. 发明人 KAMIYA, MASAAKI, C/O SEIKO INSTRUMENTS INC.;AOKI, KENJI, C/O SEIKO INSTRUMENTS INC.;SAITO, NAOTO, C/O SEIKO INSTRUMENTS INC.
分类号 H01L21/225;H01L21/336;H01L29/08;H01L29/78 主分类号 H01L21/225
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