发明名称 |
SUPERSONIC V(Z) CHARACTERISTIC MEASURING DEVICE |
摘要 |
PURPOSE:To obtain a supersonic V(Z) characteristic measuring device for enabling V(Z) characteristics to be measured highly accurately. CONSTITUTION:By setting so that a position of a gate is followed according to an amount of travel of an acoustic probe in reference to a delay time of the gate which is set at an initial position, an interference wave portion can be extracted even if the gate width is set to a narrow value, thus enabling the interference wave to be taken out accurately and an accurate measurement peak value within that range. As a result, a period of a peak value of the interference wave can be measured accurately and more accurate V(Z) characteristics can be obtained. |
申请公布号 |
JPH04286954(A) |
申请公布日期 |
1992.10.12 |
申请号 |
JP19910075854 |
申请日期 |
1991.03.15 |
申请人 |
HITACHI CONSTR MACH CO LTD |
发明人 |
NAKAJIMA MASAYASU;YUASA KAZUHIRO |
分类号 |
G01N29/06;G01N29/22;G01N29/44 |
主分类号 |
G01N29/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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