发明名称 SUPERSONIC V(Z) CHARACTERISTIC MEASURING DEVICE
摘要 PURPOSE:To obtain a supersonic V(Z) characteristic measuring device for enabling V(Z) characteristics to be measured highly accurately. CONSTITUTION:By setting so that a position of a gate is followed according to an amount of travel of an acoustic probe in reference to a delay time of the gate which is set at an initial position, an interference wave portion can be extracted even if the gate width is set to a narrow value, thus enabling the interference wave to be taken out accurately and an accurate measurement peak value within that range. As a result, a period of a peak value of the interference wave can be measured accurately and more accurate V(Z) characteristics can be obtained.
申请公布号 JPH04286954(A) 申请公布日期 1992.10.12
申请号 JP19910075854 申请日期 1991.03.15
申请人 HITACHI CONSTR MACH CO LTD 发明人 NAKAJIMA MASAYASU;YUASA KAZUHIRO
分类号 G01N29/06;G01N29/22;G01N29/44 主分类号 G01N29/06
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