发明名称 TEST POINT MONITORING CIRCUIT OF ASIC INTERNAL
摘要 The circuit connects a multiplexer to a multitude of flip-flops, selectively specifies a test point of the multiplexer, and limits an input channel of the multiplexer. The circuit includes a switching control unit (10) which outputs a switching control signals according to system clock signal (SCLK), a switching selector (20) which selectively outputs an outputs signals (Pi-Pi+(n-1)) of test points, a multiplexer (30) which selectively outputs an actual ouptut signal (Pi) or switching selector (20) output signal. The switching control unit (10) includes flip-flops (FF50-FF5n). The switching selector (20) includes buffers (B1-Bn).
申请公布号 KR940007952(B1) 申请公布日期 1994.08.29
申请号 KR19910020622 申请日期 1991.11.19
申请人 GOLDSTAR CO., LTD. 发明人 IM, MUN - HWAN
分类号 H03K19/00;(IPC1-7):H03K19/00 主分类号 H03K19/00
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