| 摘要 |
Disclosed is a measuring apparatus in which electrical characteristics of electronic parts can be measured in a substantially reduced measurement time. The measuring apparatus includes a tray for mounting a plurality of the electronic parts, a measuring mechanism having a plurality of measuring terminals positioned in accordance with the respective positions of the electrodes in the plurality of electronic parts mounted on the tray, and a drive mechanism for moving the tray and the measuring mechanism relative to each other to thereby cause the respective electrodes of the electronic parts mounted on the tray engage the corresponding measuring terminals in the measuring mechanism.
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