发明名称 Semiconductor processing method of providing an electrically conductive interconnecting plug between an elevationally inner electrically conductive node and an elevationally outer electrically conductive node
摘要 A semiconductor processing method of providing an electrically conductive interconnecting plug between an elevationally inner conductive node and an elevationally outer conductive node includes, a) providing an inner node location to which electrical connection is to be made; b) providing an electrically insulative layer outwardly over the inner node location; c) patterning and etching a contact opening through the insulative layer to the inner node location; d) substantially filling the contact opening with an electrically conductive material to provide a conductive plug within the contact opening to the inner node location, the conductive plug defining an outermost fang gap between the conductive plug and the electrically insulative layer, the fang gap having a first width; e) widening the fang gap to a second width which is greater than the first width by a timed RF plasma etch of the electrically conductive material; f) providing an outer metal layer over the conductive plug after the widening step, the metal layer at least partially filling the widened fang gap; and g) patterning the metal layer into a conductive line which electrically interconnects with the conductive plug.
申请公布号 US5496773(A) 申请公布日期 1996.03.05
申请号 US19950430758 申请日期 1995.04.28
申请人 MICRON TECHNOLOGY, INC. 发明人 RHODES, HOWARD E.;O'BRIEN, TIMOTHY P.;LANGLEY, ROD C.
分类号 H01L21/3213;H01L21/768;(IPC1-7):H01L21/283;H01L21/306 主分类号 H01L21/3213
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