发明名称 POLYCRYSTALLINE SILICON FORMED BY CRYSTALLIZATION OF MICROCRYSTALLINE SILICON AND ITS FORMING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a method for forming a thin film transistor semiconductor film composed of polycrystalline silicon formed by crystallization of microcrystalline silicon. SOLUTION: A method which forms a polycrystalline silicon film from a microcrystal silicon film includes a step of depositing a microcrystalline silicon film 14 including microcrystallites buried in amorphous substance, a step of annealing the deposited film 14 and, at least, partially forming a polycrystalline film, and a step of promoting formation of uniform crystal particles 28, 30 having comparatively large size by allowing the amorphous substance to contain buried seed crystals 16.
申请公布号 JP2000068203(A) 申请公布日期 2000.03.03
申请号 JP19990219218 申请日期 1999.08.02
申请人 SHARP CORP 发明人 VOUTSAS TOLIS
分类号 H01L21/20;H01L21/336;H01L29/786;(IPC1-7):H01L21/20 主分类号 H01L21/20
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