发明名称 CONE FOR ICP-MS
摘要 PROBLEM TO BE SOLVED: To inhibit cutting by a plasma and to realize a long life by curing at least orifice periphery for introducing a sample of a cone used as an interface connecting an induction bond plasma generating device and a mass analyzer by melting by an energy beam. SOLUTION: A cured portion 15 of a sampling cone 2 and a skimmer cone 4 made of copper and defining a first chamber to which an ionized sample stream from a plasma generating device flows through an orifice 3 is formed into an alloy by an electron beam reforming method and are not simply cut-out by a plasma sputtering. Preferably, one end surface center portion of a base material from which a round bar made of copper is cut to a cylindrical shape having a predetermined thickness is formed to a fine intermetallic compound of several percent of aluminum and copper by a quenching after irradiation of an electron beam and the alloy area having a high hardness is cut-out by a lathe on the like to form a tip end of orifices 3, 5. After the cone is molded of the base material, a shallow area may be reformed by melting and curing it by a laser beam.
申请公布号 JP2000067803(A) 申请公布日期 2000.03.03
申请号 JP19980231485 申请日期 1998.08.18
申请人 JEOL LTD 发明人 OTSUKA KIICHIRO
分类号 H01J49/04;(IPC1-7):H01J49/04 主分类号 H01J49/04
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