发明名称 |
APPARATUS FOR TESTING RESISTOR CHARACTERISTIC OF MULTI-FUNCTION TESTER |
摘要 |
PURPOSE: A resistor characteristic testing apparatus is provided to test a characteristic of a resistor mounted at a printed circuit board(PCB) by calculating a V-I characteristic graph of the resistor and then judging whether the resistor is defective by comparing the calculated V-I characteristic graph with predetermined characteristic data. CONSTITUTION: A resistor characteristic testing apparatus comprises a personal computer(PC)(10) which stores characteristic data of resistors and has a key input(20) and a display part(30). The key input part(20) makes a user select a voltage range supplied to a resistor and a current range inputted from the resistor. A communication part(40) connects the PC(10) to a main control part(50). A data buffer(60) adjusts data speed and time between the main control part(50) and a main memory part(70). The main memory part(70) stores sinusoidal wave pattern data. An analog signal generating part(80) converts a digital signal from the main memory part(70) into an analog signal, and a supply voltage range selecting part(90) outputs one of a plurality of supply voltage ranges which is selected by the user. A first buffer/filter(100) adjusts and filters a speed and a time of the selected supply voltage to supply the adjusted and filtered voltage to a resistor. An input current range selecting part(110) outputs one of a plurality of input current ranges which is selected by the user. A second buffer/filter(120) adjusts and filters a speed and a time of the selected input current, and an analog signal measuring part(130) converts an analog signal from the buffer/filter(120) into a digital signal.
|
申请公布号 |
KR20000042722(A) |
申请公布日期 |
2000.07.15 |
申请号 |
KR19980059000 |
申请日期 |
1998.12.26 |
申请人 |
DAEWOO ELECTRONICS CO., LTD. |
发明人 |
KIM, BONG SEOK |
分类号 |
G01R27/00;(IPC1-7):G01R27/00 |
主分类号 |
G01R27/00 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|