发明名称 METHOD OF TESTING IC
摘要 PROBLEM TO BE SOLVED: To continue a test without changing a test program even when a trouble in a resource is generated. SOLUTION: When the resource trouble is generated, an FKn switch is turned on (S1) and an INIT switch is truned on (S2), a variable for indicating a corresponding unused normal resource is set to be input to a the troubled resource in a variable set-inputting process (S3), the variable indicating the troubled resource is defined to be reread in a variable rereading process (S4) by the normal resource indicating variable set-input hereinbefore, and then a test condition for the corresponding resource is set in a test condition setting process (S5) as in a normal procedure based on the respective resource indicating variables. The indication variable of the troubled resource sets the test condition for the resource of the indication variable defined to be reread. The variables defined to be reread are used hereinafter as the variables of the troubled resources by the same manner.
申请公布号 JP2001108722(A) 申请公布日期 2001.04.20
申请号 JP19990283918 申请日期 1999.10.05
申请人 ADVANTEST CORP 发明人 INOUE TATSUO
分类号 G01R31/28;(IPC1-7):G01R31/28 主分类号 G01R31/28
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