| 摘要 |
PROBLEM TO BE SOLVED: To measure extension displacement of sample at a relatively low cost, easily and surely by using noncontact type but general image analysis program taking advantage of speckle pattern of laser light. SOLUTION: To a first mark line equivalent point on a sample surface and to a second mark line equivalent point apart for a specific distance from the first mark line equivalent point, laser light is irradiated. The speckle pattern of the scattered light of reflection light of the laser light during measuring extension displacement is digitized with an image element, such as a CCD. Then, the digital data is converted to image data of particle and analyzed with a PIV analysis program. In the analysis, interference fringes are interpreted as extrusion of the particles. From the image before and after the displacement, the quantity of movement of the first and the second mark line equivalent points are calculated individually, and the extension displacement of the sample between the first and the second mark line equivalent points is obtained from the quantity of both movement.
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