发明名称 PLASMA ETCHER FOR MANUFACTURING SEMICONDUCTOR
摘要 PURPOSE: A plasma etcher for manufacturing a semiconductor is provided to prevent a wafer from being contaminated by particles by controlling generation of particles, and improve yield of a wafer etching process by extending a cleaning period of particles. CONSTITUTION: A process chamber injection hole(11) is formed in one side of a chamber(100), and an exhaust hole(12) is formed in the other side of the chamber. The upper portion of the chamber is composed of a quartz material. An electrostatic chuck(13) is installed in the lower portion of the inside of the chamber, and a wafer(14) is located in the electrostatic chuck. Radio frequency(RF) power is applied to the electrostatic chuck. A coil(15) surround the outside of the upper portion of the chamber. RF power is applied to the chamber to generate plasma inside the chamber.
申请公布号 KR20010048079(A) 申请公布日期 2001.06.15
申请号 KR19990052594 申请日期 1999.11.25
申请人 HYNIX SEMICONDUCTOR INC. 发明人 JI, PIL SEON
分类号 H01L21/3065;(IPC1-7):H01L21/306 主分类号 H01L21/3065
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