| 摘要 |
PROBLEM TO BE SOLVED: To facilitate a test of a boundary area between blocks of a device made by combining a block made up of a combination of standard cells with a custom block made up of a macro block and an IP. SOLUTION: The custom block CB1 is designed, with a means added thereto for performing computations, such as EXOR computation simpler than usual operation and outputting it when the block CB1 is put into scan mode. This simplifies logical relations between input and output, without being affected by the history of data in the past stored in memories and registers contained in the block CB1. Similarly to the standard cell block SCB1 using a scan method, test patterns can be produced automatically by ATPG.
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