发明名称 Carrier head with a substrate detection mechanism for a chemical mechanical polishing system
摘要 A carrier head for a chemical mechanical polishing system includes a substrate sensing mechanism. The carrier head includes a base and a flexible member connected to the base to define a chamber. A lower surface of the flexible member provides a substrate receiving surface. The substrate sensing mechanism includes a sensor to measure a pressure in the chamber and generate an output signal representative thereof, and a processor configured to indicate whether the substrate is attached to the substrate receiving surface in response to the output signal.
申请公布号 US6343973(B1) 申请公布日期 2002.02.05
申请号 US20000595500 申请日期 2000.06.16
申请人 APPLIED MATERIALS, INC. 发明人 SOMEKH SASSON
分类号 B24B37/04;H01L21/304;(IPC1-7):B24B49/00 主分类号 B24B37/04
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