发明名称 |
CSP TYPE SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF |
摘要 |
<p>PURPOSE: A CSP(Chip Scale Package) type semiconductor device and manufacturing method thereof are provided to be capable of considerably improving current efficiency. CONSTITUTION: A CSP type semiconductor device is provided with a semiconductor substrate(101), the first conductive type epitaxial layer(102) formed at the upper portion of the semiconductor substrate, and a plurality of second conductive type impurity regions(103) spaced apart from each other at the first conductive type epitaxial layer. The CSP type semiconductor device further includes a plurality of first comb type electrodes(115) formed between the second conductive type impurity regions at the first conductive type epitaxial layer, and a plurality of second comb type electrodes(116) formed at the second conductive type impurity region. The CSP type semiconductor device further includes the first and second connection part, and a protecting layer(119) formed at the upper portion of the semiconductor substrate.</p> |
申请公布号 |
KR20040006973(A) |
申请公布日期 |
2004.01.24 |
申请号 |
KR20020041590 |
申请日期 |
2002.07.16 |
申请人 |
SAMSUNG ELECTRO-MECHANICS CO., LTD. |
发明人 |
HAN, YEONG SEOK;OH, BANG WON;YOON, SANG BOK |
分类号 |
H01L21/60;(IPC1-7):H01L21/60 |
主分类号 |
H01L21/60 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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