发明名称 CSP TYPE SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 <p>PURPOSE: A CSP(Chip Scale Package) type semiconductor device and manufacturing method thereof are provided to be capable of considerably improving current efficiency. CONSTITUTION: A CSP type semiconductor device is provided with a semiconductor substrate(101), the first conductive type epitaxial layer(102) formed at the upper portion of the semiconductor substrate, and a plurality of second conductive type impurity regions(103) spaced apart from each other at the first conductive type epitaxial layer. The CSP type semiconductor device further includes a plurality of first comb type electrodes(115) formed between the second conductive type impurity regions at the first conductive type epitaxial layer, and a plurality of second comb type electrodes(116) formed at the second conductive type impurity region. The CSP type semiconductor device further includes the first and second connection part, and a protecting layer(119) formed at the upper portion of the semiconductor substrate.</p>
申请公布号 KR20040006973(A) 申请公布日期 2004.01.24
申请号 KR20020041590 申请日期 2002.07.16
申请人 SAMSUNG ELECTRO-MECHANICS CO., LTD. 发明人 HAN, YEONG SEOK;OH, BANG WON;YOON, SANG BOK
分类号 H01L21/60;(IPC1-7):H01L21/60 主分类号 H01L21/60
代理机构 代理人
主权项
地址