发明名称 |
DEVELOPING DEVICE, DEVELOPING METHOD, CHARGED PARTICLE BEAM PLOTTING DEVICE, AND CHARGED PARTICLE BEAM PLOTTING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide a developing device and a developing method capable of executing highly accurate development by correcting dimensional errors in the line width of a pattern which are generated due to variation in atmospheric pressures. SOLUTION: The developing device is provided with an atmospheric pressure measuring part 101, and a control part 106 controls the projection pressure of a developing solution 105 projected from a nozzle 103 by a developing solution projection part 104 on the basis of correlation information between dimensional errors in the line width of a pattern which are generated under a plurality of atmospheric pressures and the measured atmospheric pressures. Consequently, highly accurate development can be achieved by correcting errors due to variation in atmospheric pressures. COPYRIGHT: (C)2008,JPO&INPIT |
申请公布号 |
JP2008198895(A) |
申请公布日期 |
2008.08.28 |
申请号 |
JP20070034406 |
申请日期 |
2007.02.15 |
申请人 |
NUFLARE TECHNOLOGY INC |
发明人 |
MOTOSUGI TOMOO;ONISHI TAKAYUKI |
分类号 |
H01L21/027;G03F7/30 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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