发明名称 |
SEMICONDUCTOR DEVICE MANUFACTURING METHOD, SEMICONDUCTOR DEVICE, AND ELECTRONIC DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To allow an InP substrate to be reused by forming a device layer subjected to pseudo-lattice matching or lattice matching on the InP substrate and peeling the InP substrate from the device layer. SOLUTION: A semiconductor device manufacturing method comprises a step for forming a sacrificial layer 12 for achieving pseudo-lattice matching or lattice matching on an indium-phosphorus (InP) substrate 11, a step for forming a device layer 13 on the sacrificial layer 12, and a step for separating the InP substrate 11 and the device layer 13 with the sacrificial layer 12 removed. COPYRIGHT: (C)2009,JPO&INPIT
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申请公布号 |
JP2008258563(A) |
申请公布日期 |
2008.10.23 |
申请号 |
JP20070250647 |
申请日期 |
2007.09.27 |
申请人 |
SONY CORP |
发明人 |
TANIGUCHI OSAMU;ONO HIDEKI;SUZUKI JUICHI |
分类号 |
H01L21/20;H01L21/331;H01L29/737 |
主分类号 |
H01L21/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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