发明名称 SEMICONDUCTOR DEVICE MANUFACTURING METHOD, SEMICONDUCTOR DEVICE, AND ELECTRONIC DEVICE
摘要 PROBLEM TO BE SOLVED: To allow an InP substrate to be reused by forming a device layer subjected to pseudo-lattice matching or lattice matching on the InP substrate and peeling the InP substrate from the device layer. SOLUTION: A semiconductor device manufacturing method comprises a step for forming a sacrificial layer 12 for achieving pseudo-lattice matching or lattice matching on an indium-phosphorus (InP) substrate 11, a step for forming a device layer 13 on the sacrificial layer 12, and a step for separating the InP substrate 11 and the device layer 13 with the sacrificial layer 12 removed. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008258563(A) 申请公布日期 2008.10.23
申请号 JP20070250647 申请日期 2007.09.27
申请人 SONY CORP 发明人 TANIGUCHI OSAMU;ONO HIDEKI;SUZUKI JUICHI
分类号 H01L21/20;H01L21/331;H01L29/737 主分类号 H01L21/20
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