发明名称 AUTOMATIC TEST CONTROL
摘要 PURPOSE:To monitor the object of a test with ease without stopping the operation of a CPU by providing with an adaptor device for testing and a memory possessing the same address as that of the internal register of the test object within the adaptor device. CONSTITUTION:An adaptor device 10 for a test is provided between a CPU1 and an automatic test machine 2, and the registers A-C in the CPU1 and the registers A'-C' in the unit 10 are so arranged that read and write can be applied for them in the same address. Then, the address of the CPU1 is given to the registers A-C through a decoder 12, and at the same time, to registers A'-C' and the data are written on registers A-C and A'-C' respectively. On the other hand, the address from the test machine 2 is fed to the decoder 16 of the unit 10 and the contents of registers A'-C' are read on the test machine 2. Thereby without stopping the operation of the CPU 1, monitoring the CPU1 is facilitated and the volume of hardware of the CPU1 is reduced.
申请公布号 JPS5798049(A) 申请公布日期 1982.06.18
申请号 JP19800174097 申请日期 1980.12.10
申请人 FUJITSU KK 发明人 TOKUTAKE YOSHIO
分类号 G06F11/22 主分类号 G06F11/22
代理机构 代理人
主权项
地址