In-process material characterization

摘要

Various embodiments include solutions for in-process material characterization. Various particular embodiments include a computer-implemented method including: providing instructions for transmitting oscillating electromagnetic field signals to a material under test (MUT); obtaining a return signal associated with the transmitted oscillating electromagnetic field signals; comparing the return signal with the oscillating electromagnetic field signals to determine a difference in an aspect of the return signal and the aspect of the oscillating electromagnetic field signals; comparing the difference in the aspect to a predetermined threshold; and determining a characteristic of the MUT based upon the compared difference.

主权项

1. A system comprising:
an array of electrodes for non-conductively communicating with a material under test (MUT); a signal generator operably connected with the array of electrodes, the signal generator for transmitting oscillating electromagnetic field signals from the array of electrodes at a range of frequencies; and at least one computing device operably connected with the signal generator and the array of electrodes, the at least one computing device configured to:
obtain a return signal from the array of electrodes about the MUT;compare the return signal with the oscillating electromagnetic field signals to determine a difference in an aspect of the return signal and the aspect of the oscillating electromagnetic field signals;compare the difference in the aspect to a predetermined threshold; anddetermine a characteristic of the MUT based upon the compared difference in the aspect and the predetermined threshold, wherein the compared difference in the aspect of the return signal and the aspect of the transmitted oscillating electromagnetic field signals represents a complex impedance of the MUT, and wherein the characteristic of the MUT is determined using an algorithm including a function of a susceptance or conductance of the MUT over the range of frequencies, or an empirical correlation of the complex impedance to one or more physical properties of the MUT.