发明名称 ELECTRON IMPACT-TYPE MULTIPLICATION TUBE USING SOLID-STATE IMAGE PICKUP ELEMENT
摘要 PURPOSE:To make falsely increase picture elements for hightening resolution by a method wherein in the first signal read period a signal corresponding to the debunched coverage is red while in the next signal read period an electron beam having been inciding into a reactive region is guided to the coverage for making signal conversion. CONSTITUTION:A multiplication tube is provided with deflecting electrodes 55 being controlled by a deflecting pulse. The deflecting electrodes are put in the state, wherein no deflecting voltage HDEF is impressd, as shown in Fig.(b), whereby an electron beam image as shown in Fig. (c) is radiated on a picture element in Fig. (a). The signal to be obtained from the picture element, when VM is given to the field shift gate voltage (phiFSG) for making transfer as shown in Fig. (d) after accumulation in the A field, becomes a value corresponding to the white of a black-and-white picture as shown in Fig. (e). When entering the next B field, the voltage VM, is impressd on the deflecting voltage HDEF of the deflectig electrode to perform deflection of the electron beam in the horizontal direction. Through said operation the electron beam from a photo electric surface moves in the horizontal direction. Thereby threshold resolution can be multiplied at a stroke.
申请公布号 JPS58133747(A) 申请公布日期 1983.08.09
申请号 JP19820014862 申请日期 1982.02.03
申请人 TOKYO SHIBAURA DENKI KK 发明人 HARADA NOZOMI;YOSHIDA OKIO
分类号 H01J31/26;H01J31/49;H04N5/335;H04N5/341;H04N5/355;H04N5/357;H04N5/3728 主分类号 H01J31/26
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