| 摘要 |
PURPOSE:To improve the monitor precision of the state in a chip by incorporating a testing circuit in a one-chip microcomputer. CONSTITUTION:The testing circuit 10 is incorporated on the one-chip microcomputer 6. The testing circuit 10 consists of a signal line 12 such as a bus line, testing logical opration unit 13, testing accumulator 14, and output terminal 15; the testing logical operation unit 13 processes data on the signal line 12 by adding, subtraction, coincidence, etc., and stores the result in the accumulator 14, and the stored data is outputted from the output terminal 15. Therefore, two kinds among plural internal signal systems are selected at first and made into one kind of signal system by arithmetical compression to be outputted from the chip, so it is not necessary to combine a gate group to be checked and processing complicatedly. |
