| 摘要 |
PURPOSE:To shorten a measurement time by separating high-order diffracted light, such as primary diffracted light, secondary diffracted light, and tertiary diffracted light, which is obtained at the same time from the projection light of a spectroscope using a diffraction grating into light beams of respective degrees, and detecting time individually. CONSTITUTION:For example, when a diffraction grating spectroscope is used and a wavelength dial is set to 1,000nm, light obtained from its projection slit is light of 500nm in wavelength as secondary diffracted light, light of 333.3nm as tertiary diffracted light, etc., in addition to light of 1,000nm as primary diffracted light. The primary diffracted light and its high-order diffracted light obtained from the projection slit 9 are separated through an optical system by degrees and they are detected individually by photodetectors 14 and 15. Consequently, the distance of wavelength scanning is shortened and the measurement time is shortened. |
