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发明名称
PHOTOTHERMAL EXAMINATION METHOD AND CORRESPONDING EXAMINATION UNIT
摘要
본 발명에 따른 방법에서, 특징이 평가될 제 1 구역(50) 및 제 2 구역(58)은 동시에 스캐닝되고, 제 1 감광 표면(56) 및 제 2 감광 표면(62)은 이들 2 개의 구역에 의해 방출되는 적외선 복사의 이미지를 획득하기 위해 서로 분리되어 있다.
申请公布号
KR20160146768(A)
申请公布日期
2016.12.21
申请号
KR20167030335
申请日期
2015.04.29
申请人
아레바 엔피
发明人
사우링르, 요닉;다그리오네, 마치에우
分类号
G01N25/72
主分类号
G01N25/72
代理机构
代理人
主权项
地址
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