发明名称 MASK, METHOD FOR USING MASK, AND ION MILLING DEVICE INCLUDING MASK
摘要 PROBLEM TO BE SOLVED: To provide: a mask that is hardly cut by ion beams and is easily handled, in order to address such problems that, for example, when a mask is formed of a metal material such as titanium and molybdenum, the mask is easily cut by ion beams, so that the life tends to be shortened, and for example, when a mask is formed of carbon graphite, the mask is hardly cut by ion beams, but is easily cracked and difficult to be handled due to properties of materials; a method for using a mask; and an ion milling device including a mask.SOLUTION: A mask 8 according to the present invention is formed of an alloy comprising carbon and the remainder of tungsten and inevitable impurities.SELECTED DRAWING: Figure 1
申请公布号 JP2016212956(A) 申请公布日期 2016.12.15
申请号 JP20150092425 申请日期 2015.04.28
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 HORINOUCHI TAKETO
分类号 H01J37/30;H01J37/305 主分类号 H01J37/30
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