发明名称 |
SUBSTRATE PROCESSING APPARATUS |
摘要 |
The present invention provides a technique in which a reduction in yield rate caused by particles occurring in the processing furnace is suppressed. The technique includes a substrate processing apparatus comprising a transfer chamber including a gas supply mechanism on a side surface thereof and configured to transfer a substrate to a substrate holder, a processing furnace, a furnace opening, a cap having the substrate holder placed thereon and configured to close the furnace opening, a raising/lowering mechanism configured to raise and lower the cap, a measurer installed at a position facing the gas supply mechanism in the transfer chamber with the substrate holder interposed therebetween, and configured to count a number of particles at the furnace opening, and a control unit configured to control the raising/lowering mechanism and the measurer so as to start measurement of a number of particles by the measurer when the furnace opening is opened. |
申请公布号 |
US2016365264(A1) |
申请公布日期 |
2016.12.15 |
申请号 |
US201615245728 |
申请日期 |
2016.08.24 |
申请人 |
HITACHI KOKUSAI ELECTRIC INC. |
发明人 |
TOKUNOBU Akao;TANIYAMA Tomoshi |
分类号 |
H01L21/67;H01L21/677;F27D21/00;H01L21/673 |
主分类号 |
H01L21/67 |
代理机构 |
|
代理人 |
|
主权项 |
1. A substrate processing apparatus comprising:
a transfer chamber including a gas supply mechanism on a side surface thereof and configured to transfer a substrate to a substrate holder; a processing furnace configured to process the substrate bolded in the substrate holder; a furnace opening that communicates between the transfer chamber and the processing furnace; a cap having the substrate holder placed thereon and configured to close the furnace opening; a raising/lowering mechanism configured to raise and lower the cap; a measurer installed at a position facing the gas supply mechanism in the transfer chamber with the substrate holder interposed therebetween, and configured to count a number of particles at the furnace opening; and a control unit configured to control the raising/lowering mechanism and the measurer so as to start measurement of a number of particles by the measurer when the furnace opening is opened. |
地址 |
Tokyo JP |