发明名称 |
Detection of defects by thermographic analysis |
摘要 |
A mechanism is provided for detecting a defect in a populated sample having a thickness dimension substantially smaller than the length and width dimensions thereof, the populated sample having a first side and an opposite second side, at least said first side of said populated sample having one or more Surface Mounted Components. The mechanism exploits a standard thermographic image which may be used in a detection method comprising 1) directing a thermal wave at said second side of said populated sample 2) recording a thermographic image of the first side of said populated sample once a surface thereof reaches a predetermined transit temperature or a predetermined transit time period has elapsed; and 3) analysing the obtained thermographic image by comparing the so obtained thermographic image with a standard thermographic image.
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申请公布号 |
US7401976(B1) |
申请公布日期 |
2008.07.22 |
申请号 |
US20000648140 |
申请日期 |
2000.08.25 |
申请人 |
ART ADVANCED RESEARCH TECHNOLOGIES INC. |
发明人 |
SCHLAGHECK JERRY;PASTOR MARC |
分类号 |
G01N25/72 |
主分类号 |
G01N25/72 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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