| 摘要 |
PROBLEM TO BE SOLVED: To provide a technology for enabling an electronic equipment designer to relatively easily measure the terminal part temperature approximate value of a resistor on the basis of a thermal image obtained by an infrared thermograph.SOLUTION: The heat evaluation method of an electronic component having a terminal part using an infrared thermograph device includes steps of: measuring the temperature distribution of the electronic component as first data from an infrared image captured by a predetermined magnification ratio; performing filtering processing to the first data to calculate second data; and calculating the temperature of the terminal part from a value indicating a peak temperature in the second data.SELECTED DRAWING: Figure 5 |
