发明名称 |
Word line compensation for memory arrays |
摘要 |
A method is provided for operating a non-volatile storage system that includes a plurality of bit lines, a word line comb including a plurality of word lines, and a plurality of memory elements, each memory element coupled between one of the bit lines and one of the word lines. The method includes receiving a current conducted by the word line comb, estimating a resistance of a conductive path between the word line comb and a selected word line voltage node, and generating a voltage at the selected word line voltage node based on the received current and the estimated resistance so that a voltage of the word line comb substantially equals a reference voltage. |
申请公布号 |
US9595323(B1) |
申请公布日期 |
2017.03.14 |
申请号 |
US201615015672 |
申请日期 |
2016.02.04 |
申请人 |
SanDisk Technologies LLC |
发明人 |
Chen Yingchang;Lee Jeffrey Koonyee;Siau Chang;Nigam Anurag;Yan Thomas |
分类号 |
G11C11/16;G11C13/00 |
主分类号 |
G11C11/16 |
代理机构 |
Vierra Magen Marcus LLP |
代理人 |
Vierra Magen Marcus LLP |
主权项 |
1. A method for operating a non-volatile storage system comprising a plurality of bit lines, a word line comb comprising a plurality of word lines, and a plurality of memory elements, each memory element coupled between one of the bit lines and one of the word lines, the method comprising:
receiving a current conducted by the word line comb, the current comprising a sum of currents conducted by the word lines; estimating a resistance of a conductive path between the word line comb and a selected word line voltage node; and generating a voltage at the selected word line voltage node based on the received current and the estimated resistance so that a voltage of the word line comb substantially equals a reference voltage. |
地址 |
Plano TX US |