发明名称 SYSTEM AND METHOD FOR SPECULAR SURFACE INSPECTION
摘要 Embodiments described herein relate to systems and methods for specular surface inspection, and particularly to systems and methods for surface inspection comprising inverse synthetic aperture imaging ("ISAI") and specular surface geometry imaging ("SSGI"). Embodiments may allow an object under inspection, to be observed, imaged and processed while continuing to be in motion. Further, multiple optical input sources may be provided, such that the object does not have to be in full view of all optical sensors at once. Further, multi-stage surface inspection may be provided, wherein an object under inspection may be inspected at multiple stages of an inspection system, such as, for an automotive painting process, inspection at primer, inspection at paint, inspection at final assembly. SSGI imaging modules are also described for carrying out micro-deflectometry.
申请公布号 CA2941729(A1) 申请公布日期 2017.03.14
申请号 CA20162941729 申请日期 2016.09.14
申请人 SIGHTLINE INNOVATION INC. 发明人 TRENHOLM, WALLACE;MAVINKURVE, MAITHILI;ALEXIUK, MARK;CASSIDY, JASON
分类号 G01N21/89;G01B11/245;G01B11/25;G01B11/30;G01N21/55;G01S13/90 主分类号 G01N21/89
代理机构 代理人
主权项
地址