发明名称 Semiconductor device and method of fabricating the same
摘要 A semiconductor device includes an isolation layer defining an active region formed in a semiconductor substrate. A first recessing process is performed on the isolation layer to expose edge portions of the active region. A first rounding process is performed to round the edge portions of the active region. A second recessing process is performed on the isolation layer. A second rounding process is performed to round the edge portions of the active region.
申请公布号 US9595612(B2) 申请公布日期 2017.03.14
申请号 US201615006522 申请日期 2016.01.26
申请人 Samsung Electronics Co., Ltd. 发明人 Kim Jung-Hwan;Leam Hun-Hyeoung;Kim Tae-Hyun;Nam Seok-Woo;Namkoong Hyun;Kim Yong-Seok;Yu Tea-Kwang
分类号 H01L29/76;H01L29/78;H01L21/28;H01L21/762;H01L21/8234;H01L27/115;H01L29/423;H01L29/66;H01L29/06;H01L29/10 主分类号 H01L29/76
代理机构 Myers Bigel, P.A. 代理人 Myers Bigel, P.A.
主权项 1. A semiconductor device comprising: a semiconductor substrate: a semiconductor active region on a surface of the semiconductor substrate, wherein the semiconductor active region protrudes away from the surface of the semiconductor substrate; and an isolation layer on the surface of the semiconductor substrate to define the semiconductor active region, wherein a top surface level of the isolation layer is lower than a top surface level of the semiconductor active region; wherein a first portion of a sidewall of the semiconductor active region below the surface of the isolation layer has a first slope, wherein a second portion of the sidewall of the semiconductor active region beyond the surface of the isolation layer has a second slope different than the first slope, and wherein a third portion of the sidewall of the semiconductor active region beyond the surface of the isolation layer has a third slope different than the first and second slopes.
地址 KR