发明名称 |
Semiconductor device and method of fabricating the same |
摘要 |
A semiconductor device includes an isolation layer defining an active region formed in a semiconductor substrate. A first recessing process is performed on the isolation layer to expose edge portions of the active region. A first rounding process is performed to round the edge portions of the active region. A second recessing process is performed on the isolation layer. A second rounding process is performed to round the edge portions of the active region. |
申请公布号 |
US9595612(B2) |
申请公布日期 |
2017.03.14 |
申请号 |
US201615006522 |
申请日期 |
2016.01.26 |
申请人 |
Samsung Electronics Co., Ltd. |
发明人 |
Kim Jung-Hwan;Leam Hun-Hyeoung;Kim Tae-Hyun;Nam Seok-Woo;Namkoong Hyun;Kim Yong-Seok;Yu Tea-Kwang |
分类号 |
H01L29/76;H01L29/78;H01L21/28;H01L21/762;H01L21/8234;H01L27/115;H01L29/423;H01L29/66;H01L29/06;H01L29/10 |
主分类号 |
H01L29/76 |
代理机构 |
Myers Bigel, P.A. |
代理人 |
Myers Bigel, P.A. |
主权项 |
1. A semiconductor device comprising:
a semiconductor substrate: a semiconductor active region on a surface of the semiconductor substrate, wherein the semiconductor active region protrudes away from the surface of the semiconductor substrate; and an isolation layer on the surface of the semiconductor substrate to define the semiconductor active region, wherein a top surface level of the isolation layer is lower than a top surface level of the semiconductor active region; wherein a first portion of a sidewall of the semiconductor active region below the surface of the isolation layer has a first slope, wherein a second portion of the sidewall of the semiconductor active region beyond the surface of the isolation layer has a second slope different than the first slope, and wherein a third portion of the sidewall of the semiconductor active region beyond the surface of the isolation layer has a third slope different than the first and second slopes. |
地址 |
KR |