SIMULATION DEVICE FOR SEMICONDUCTOR DEVICE, AND SHORT-CIRCUIT DETERMINATION METHOD FOR SEMICONDUCTOR DEVICE

摘要

the design data and the simulation data includes a comparator, an identification code assigning unit, and a short-circuit determining unit. The comparator is configured to compare design data of a semiconductor device with simulation data of the semiconductor device to extract areas different therebetween. With reference to the extracted areas extracted by the comparator, the identification code assigning unit is configured to assign different identification codes to the extracted areas corresponding to different conductors The short-circuit determining unit determines whether the extracted areas to which the different identification codes have been assigned are within a predetermined distance or not to determine a short circuit position in the semiconductor device.

主权项

1. A simulation device for a semiconductor device, comprising:
a comparator configured to compare design data of a semiconductor device with simulation data of the semiconductor device to extract areas different between the design data and the simulation data; an identification code assigning unit configured to assign, with respect to extracted areas extracted by the comparator, different identification codes to the extracted areas corresponding to different conductors; and a short-circuit determining unit that determines whether the extracted areas to which the different identification codes have been assigned are within a predetermined distance or not to determine a short circuit position in the semiconductor device.