发明名称 SYSTEMS AND METHODS FOR DETECTING MEMORY FAULTS IN REAL-TIME VIA SMI TESTS
摘要 Defective memory may cause expensive and unnecessary replacements of the memory especially for higher density dynamic random access memory that has ever shrinking topologies. Running memory stress tests in the background for a period of time at set intervals while the operating system is idle may detect and identify memory problems in real-time without requiring a re-boot of the information handling system. The memory defects may be repaired in real-time so as not to cause loss of data by future read or write requests to the identified defective memory.
申请公布号 US2017068607(A1) 申请公布日期 2017.03.09
申请号 US201514846416 申请日期 2015.09.04
申请人 Dell Products L.P. 发明人 Herzi Dirie N.;Shepherd Michael David
分类号 G06F11/32;G06F13/24;G06F11/30;G06F11/07;G06F11/22 主分类号 G06F11/32
代理机构 代理人
主权项 1. A method comprising: receiving, at an information handling system, a system management interrupt (SMI); determining if a processor is in an idle state; performing a memory stress test on a memory for a predetermined memory stress test time period, wherein during the memory stress test the memory is not available; detecting a post package repair (PPR) support; receiving, by the PPR support, a memory error indicator from the memory stress test, wherein the memory error indicator indicates that the memory includes a defective memory portion; applying, by the PPR support, a repair to the defective memory portion; and releasing the memory.
地址 Round Rock TX US