发明名称 SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD
摘要 Provided is a semiconductor device having a highly reliable through via hole. This semiconductor device has: a semiconductor substrate; first wiring formed in a first wiring layer on the semiconductor substrate; a through via hole, which is penetrating the semiconductor substrate, and is connected to the first wiring; and a first insulating film positioned at an area corresponding to an inter-wiring space of the first wiring, said area being at the interface between the through via hole and the first wiring layer.
申请公布号 WO2017038108(A1) 申请公布日期 2017.03.09
申请号 WO2016JP53635 申请日期 2016.02.08
申请人 SOCIONEXT INC. 发明人 OHIRA, Hikaru;OCHIMIZU, Hirosato;OWADA, Tamotsu
分类号 H01L21/3205;H01L21/768;H01L23/522 主分类号 H01L21/3205
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