发明名称 SPACER LAYER FOR MAGNETORESISTIVE MEMORY
摘要 A bottom pinned perpendicular magnetic tunnel junction (pMTJ) with high TMR which can withstand high temperature back-end-of-line (BEOL) processing is disclosed. The pMTJ includes a composite spacer layer between a SAF layer and a reference layer of the fixed magnetic layer of the pMTJ. The composite spacer layer includes a first non-magnetic (NM) spacer layer, a magnetic (M) spacer layer disposed over the first NM spacer layer and a second NM spacer layer disposed over the M layer. The M layer is a magnetically continuous amorphous layer, which provides a good template for the reference layer.
申请公布号 US2017125664(A1) 申请公布日期 2017.05.04
申请号 US201615339928 申请日期 2016.10.31
申请人 GLOBALFOUNDRIES Singapore Pte. Ltd. 发明人 TAHMASEBI Taiebeh;NAIK Vinayak Bharat;LEE Kangho;SEET Chim Seng;YAMANE Kazutaka
分类号 H01L43/02;H01L27/22;H01L43/12;H01L43/08;H01L43/10 主分类号 H01L43/02
代理机构 代理人
主权项 1. A method of forming a device comprising: providing a substrate comprising circuit component formed on a substrate surface; performing back-end-of-line (BEOL) processing to form level dielectric (ILD) layer over the substrate, wherein the ILD layer comprises a plurality of ILD levels; and forming a magnetic tunneling junction (MTJ) stack in between adjacent ILD levels of the upper ILD layer, wherein the MTJ stack comprises a magnetic fixed layer, the magnetic fixed layer comprises a synthetic antiferromagnetic (SAF) layer,a composite spacer layer disposed on the SAF layer, the composite spacer layer comprises a first non-magnetic (NM) spacer layer,a magnetic (M) spacer layer disposed over the first NM spacer layer, anda second NM spacer layer disposed over the M layer, anda reference layer disposed over the composite spacer layer,a tunneling barrier layer disposed over the magnetic fixed layer, anda magnetic free layer disposed over the tunneling barrier layer.
地址 Singapore SG