发明名称 |
Non-contact electromagnetic illuminated detection of part anomalies for cyber physical security |
摘要 |
An apparatus for testing, inspecting or screening an electronic device for electrical characteristics, modified or unmodified hardware, or firmware modifications including Malware, Trojans, improper versioning, and the like, includes a transmitting antenna positioned at a distance from the electronic device and a electromagnetic energy receiver or sensor for examining a resulting unintentional derived electromagnetic energy from the electronic device. The receiver collects unintentional RF energy components emitted by the device and includes a processor and executable instructions that perform analysis in a response to the acquired electromagnetic energy input. The characteristics of the collected RF energy may be compared with RF energy characteristics of an exemplary device. The analysis determines one of a modified, unmodified or score of certainty of discerned condition of the device. |
申请公布号 |
US9642014(B2) |
申请公布日期 |
2017.05.02 |
申请号 |
US201514694542 |
申请日期 |
2015.04.23 |
申请人 |
NOKOMIS, INC. |
发明人 |
Keller Walter John |
分类号 |
G06F12/14;H04L9/32;H04W12/12;H04L29/06 |
主分类号 |
G06F12/14 |
代理机构 |
James Ray and Assoc.LLC |
代理人 |
James Ray and Assoc.LLC |
主权项 |
1. An apparatus for determining a state and/or a condition of an unpowered electrical device, comprising:
a waveform generator generating a waveform; a first antenna transmitting electromagnetic energy containing said waveform in a direction of the electrical device; a second antenna receiving artifact(s) unintentionally re-emitted from the electrical device due to excitation thereof with said waveform; one or more processors; and non-transitory computer readable medium containing executable or computational instructions that cause said one or more processors to perform the steps of: developing a signature of the electrical device, wherein said signature contains said artifact(s), analyzing said developed signature, and determining the state and/or condition of the electrical device based on said artifact(s) present in said signature. |
地址 |
Charleroi PA US |