发明名称 |
INTERNAL STROBE SIGNAL GENERATING CIRCUIT CAPABLE OF SELECTING DATA RATE AND SEMICONDUCTOR APPARATUS INCLUDING THE SAME |
摘要 |
An internal strobe signal generating circuit may include a data rate selection circuit, a division circuit and a strobe output circuit. The data rate selection circuit may enable a data rate selection signal according to operational information. The division circuit may generate a divided strobe signal by dividing a data strobe signal in response to the data rate selection signal. The strobe output circuit may generate, in response to the data rate selection signal, an internal strobe signal based on one of the divided strobe signal and the data strobe signal. |
申请公布号 |
US2017117031(A1) |
申请公布日期 |
2017.04.27 |
申请号 |
US201615018169 |
申请日期 |
2016.02.08 |
申请人 |
SK hynix Inc. |
发明人 |
LEE Kwang Hun |
分类号 |
G11C11/4076 |
主分类号 |
G11C11/4076 |
代理机构 |
|
代理人 |
|
主权项 |
1. An internal strobe signal generating circuit comprising:
a data rate selection circuit configured to enable a data rate selection signal according to operational information; a division circuit configured to generate a divided strobe signal by dividing a data strobe signal from an external device in response to the data rate selection signal; and a strobe output circuit configured to generate, in response to the data rate selection signal, an internal strobe signal based on one of the divided strobe signal and the data strobe signal. |
地址 |
Icheon-si Gyeonggi-do KR |