发明名称 INTERNAL STROBE SIGNAL GENERATING CIRCUIT CAPABLE OF SELECTING DATA RATE AND SEMICONDUCTOR APPARATUS INCLUDING THE SAME
摘要 An internal strobe signal generating circuit may include a data rate selection circuit, a division circuit and a strobe output circuit. The data rate selection circuit may enable a data rate selection signal according to operational information. The division circuit may generate a divided strobe signal by dividing a data strobe signal in response to the data rate selection signal. The strobe output circuit may generate, in response to the data rate selection signal, an internal strobe signal based on one of the divided strobe signal and the data strobe signal.
申请公布号 US2017117031(A1) 申请公布日期 2017.04.27
申请号 US201615018169 申请日期 2016.02.08
申请人 SK hynix Inc. 发明人 LEE Kwang Hun
分类号 G11C11/4076 主分类号 G11C11/4076
代理机构 代理人
主权项 1. An internal strobe signal generating circuit comprising: a data rate selection circuit configured to enable a data rate selection signal according to operational information; a division circuit configured to generate a divided strobe signal by dividing a data strobe signal from an external device in response to the data rate selection signal; and a strobe output circuit configured to generate, in response to the data rate selection signal, an internal strobe signal based on one of the divided strobe signal and the data strobe signal.
地址 Icheon-si Gyeonggi-do KR