发明名称 |
SEMICONDUCTOR MEMORY DEVICE THAT VARIES VOLTAGE LEVELS DEPENDING ON WHICH OF DIFFERENT MEMORY REGIONS THEREOF IS ACCESSED |
摘要 |
A semiconductor memory device includes a semiconductor memory chip including a plurality of regions of memory cells, including a first memory region and a second memory region, and a memory controller configured to carry out a read of a memory cell in the first memory region by applying a first read voltage, and a read of a memory cell in the second memory region by applying a second read voltage that is different from the first read voltage. |
申请公布号 |
US2017117032(A1) |
申请公布日期 |
2017.04.27 |
申请号 |
US201615066944 |
申请日期 |
2016.03.10 |
申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
TAKIZAWA Kazutaka;NIIJIMA Masaaki |
分类号 |
G11C11/4091;G11C11/406 |
主分类号 |
G11C11/4091 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor memory device, comprising:
a semiconductor memory chip including a plurality of regions of memory cells, including a first memory region and a second memory region; and a memory controller configured to
set a first voltage based on a first number of times the first memory region has been accessed since a predetermined point of time and carry out an operation on memory cells of the first memory region by applying the first voltage, when the first number is more than a threshold number, andset a second voltage that is different from the first voltage based on a period of time that has passed since a last access to the second memory region and carry out the operation on memory cells of the second memory region by applying the second voltage, when a second number of times the second memory region has been accessed since the predetermined point of time is less than the threshold number. |
地址 |
Tokyo JP |