发明名称 Compositions and methods for selective polishing of silicon nitride materials
摘要 The present invention provides an acidic aqueous polishing composition suitable for polishing a silicon nitride-containing substrate in a chemical-mechanical polishing (CMP) process. The composition, at point of use, preferably comprises about 0.01 to about 2 percent by weight of at least one particulate ceria abrasive, about 10 to about 1000 ppm of at least one non-polymeric unsaturated nitrogen heterocycle compound, 0 to about 1000 ppm of at least one cationic polymer, optionally, 0 to about 2000 ppm of at least one polyoxyalkylene polymer, and an aqueous carrier therefor. The cationic polymer preferably is selected from a poly(vinylpyridine) polymer, a quaternary ammonium-substituted acrylate polymer, a quaternary ammonium-substituted methacrylate polymer, or a combination thereof. Methods of polishing substrates and of selectively removing silicon nitride from a substrate in preference to removal of polysilicon using the compositions are also provided.
申请公布号 US9633863(B2) 申请公布日期 2017.04.25
申请号 US201213546552 申请日期 2012.07.11
申请人 Cabot Microelectronics Corporation 发明人 Ward William
分类号 H01B13/00;B44C1/22;C03C15/00;C03C25/68;C23F1/00;H01L21/302;H01L21/461;H01L21/3105;H01L21/311;H01L21/3213;C09K3/14;C09G1/02 主分类号 H01B13/00
代理机构 代理人 Omholt Thomas;Wilson Erika;Ross Robert J.
主权项 1. A chemical-mechanical polishing (CMP) method for selectively removing silicon nitride from a surface of a substrate in preference to removal of polysilicon, the method comprising the steps of: (a) contacting a surface of a silicon nitride- and polysilicon-containing substrate with a polishing pad and an acidic aqueous CMP composition; and (b) causing relative motion between the polishing pad and the substrate while maintaining a portion of the CMP composition in contact with the surface between the pad and the substrate for a time period sufficient to abrade silicon nitride from the surface; wherein the CMP composition comprises: (i) about 0.1 to about 0.3 percent by weight of a calcined ceria abrasive;(ii) about 10 to about 1000 ppm of at least one non-polymeric unsaturated nitrogen heterocycle compound;(iii) 10 to about 1000 ppm of at least one cationic polymer, wherein the cationic polymer comprises a poly(vinylpyridine) polymer, a quaternary ammonium-substituted acrylate polymer, a quaternary ammonium-substituted methacrylate polymer, or a combination of any of the foregoing cationic polymers;(iv) 200 to about 2000 ppm of at least one polyoxyalkylene polymer, wherein the polyoxyalkylene polymer comprises a poly(ethylene glycol) polymer, a poly(ethylene glycol)-co-poly(propylene glycol) block copolymer, or a combination thereof; and(v) an aqueous carrier therefor, wherein the CMP composition has a pH in the range of about 3 to about 5.
地址 Aurora IL US
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