发明名称 GAS-PHASE DEPOSITION PROCESS
摘要 The disclosure relates to a layer-deposition process that includes: injecting a first reagent in gaseous phase into the deposition chamber via a first injection path, and injecting a second gas-phase reagent into the deposition chamber via a second injection path, the second injection path being separate from the first injection path. The pressure in the deposition chamber is greater than a predetermined value for the entire duration of the process. The process is characterized in that the first reagent is fed into the deposition chamber according to a first pulse sequence, and the second reagent is fed into the chamber according to a second pulse sequence. The first pulse sequence and the second pulse sequence are out of phase with one another.
申请公布号 US2017107615(A1) 申请公布日期 2017.04.20
申请号 US201515127218 申请日期 2015.03.19
申请人 Altatech Semiconductor 发明人 Vitiello Julien
分类号 C23C16/455 主分类号 C23C16/455
代理机构 代理人
主权项 1. A method for gas phase deposition of a layer by reaction between two reagents on the surface of a substrate placed in a deposition chamber, the method comprising: injecting a first reagent in a gas phase into the deposition chamber through a first injection route; injecting a second reagent in a gas phase into the deposition chamber through a second injection route, the second injection route being distinct from the first injection route;wherein a pressure in the deposition chamber is greater than 500 mTorr during the whole duration of the method and the first reagent is introduced into the deposition chamber according to a first sequence of pulses, the second reagent is introduced into the deposition chamber according to a second sequence of pulses, the first sequence of pulses and the second sequence of pulses being phase-shifted.
地址 Montbonnot-Saint-Martin FR