发明名称 Display device
摘要 In a liquid crystal display device it is desirable to test in the state of TFT substrates, without reducing the number of TFT substrates to be obtained from one mother TFT substrate, and without increasing the overall size of the TFT substrates. Test terminals are formed on the outside of terminals for driving the liquid crystal display device. The test terminals of the specific TFT substrate are formed in another TFT substrate just below the specific TFT substrate. The area in which the test lines are formed is a space in which a sealing material is formed, between the display area and an end of the lower TFT substrate. Thus, the size of the TFT substrates is not actually increased. A test line area is not separately formed and not discarded, so that the number of TFT substrates to be obtained from one mother TFT substrate is not reduced.
申请公布号 US9627283(B2) 申请公布日期 2017.04.18
申请号 US201514603328 申请日期 2015.01.22
申请人 Japan Display Inc.;Panasonic Liquid Crystal Display Co., Ltd. 发明人 Gotoh Jun;Nakayama Takanori
分类号 G02F1/1345;H01L21/66;G02F1/1362;G02F1/13;G02F1/1339;G02F1/1368;H01L27/12;H01L27/32 主分类号 G02F1/1345
代理机构 Hauptman Ham, LLP 代理人 Hauptman Ham, LLP
主权项 1. A liquid crystal display device comprising: a thin-film transistor (TFT) substrate comprising: a terminal portion disposed on a first side of the TFT substrate, the terminal portion having a driving terminal and a test terminal;a plurality of lines disposed on and parallel to a second side of the TFT substrate, each line of the plurality of lines being electrically isolated from each other, the first side of the TFT substrate being opposite the second side of the TFT substrate; anda display area including scan lines, image signal lines and a plurality of pixels arranged in a matrix, the scan lines extend in a first direction and are spaced from each other in a second direction, and the image signal lines extend in the second direction and are spaced from each other in the first direction; and a counter substrate; wherein each line of the plurality of lines is free from having a node configured to be electrically connected to one or more of the scan lines or the image signal lines.
地址 Tokyo JP