发明名称 |
Deposition of metal doped amorphous carbon film |
摘要 |
Embodiments of the present disclosure relate to a metal-doped amorphous carbon hardmask for etching the underlying layer, layer stack, or structure. In one embodiment, a method of processing a substrate in a processing chamber includes exposing a substrate to a gas mixture comprising a carbon-containing precursor and a metal-containing precursor, reacting the carbon-containing precursor and the metal-containing precursor in the processing chamber to form a metal-doped carbon layer over a surface of the substrate, forming in the metal-doped carbon layer a defined pattern of through openings, and transferring the defined pattern to an underlying layer beneath the metal-doped carbon layer using the metal-doped carbon layer as a mask. An etch hardmask using the inventive metal-doped amorphous carbon film provides reduced compressive stress, high hardness, and therefore higher etch selectivity. |
申请公布号 |
US9624577(B2) |
申请公布日期 |
2017.04.18 |
申请号 |
US201514697385 |
申请日期 |
2015.04.27 |
申请人 |
APPLIED MATERIALS, INC. |
发明人 |
Manna Pramit;Mallick Abhijit Basu;Srinivasan Mukund;Cheng Rui |
分类号 |
C23F1/02;C23C16/26;C23C16/04;C23C16/06;H01J37/32;C23C16/30 |
主分类号 |
C23F1/02 |
代理机构 |
Patterson + Sheridan, LLP |
代理人 |
Patterson + Sheridan, LLP |
主权项 |
1. A method of processing a substrate in a processing chamber, comprising:
exposing a substrate to a gas mixture comprising a hydrocarbon-containing precursor and a metal-containing precursor; thermally reacting the hydrocarbon-containing precursor and the metal-containing precursor in the processing chamber to form a metal-doped amorphous carbon layer over a surface of the substrate; forming in the metal-doped amorphous carbon layer a defined pattern of through openings; and transferring the defined pattern to an underlying layer beneath the metal-doped amorphous carbon layer using the metal-doped amorphous carbon layer as a mask. |
地址 |
Santa Clara CA US |