发明名称 INTEGRATED CIRCUIT DEVICE AND METHOD OF FABRICATING THE SAME
摘要 An integrated circuit device including a substrate having at least one fin-shaped active region, the at least one fin-shaped active region extending in a first direction, a gate line extending on the at least one fin-shaped active region in a second direction, the second direction intersecting with the first direction, a conductive region on a portion of the at least one fin-shaped active region at one side of the gate line, and a contact plug extending from the conductive region in a third direction, the third direction being perpendicular to a main plane of the substrate, may be provided. The contact plug may include a metal plug, a conductive barrier film on the conductive region, the conductive barrier film surrounding a sidewall and a bottom surface of the metal plug, the conductive barrier film including an N-rich metal nitride film, and a metal silicide film between the conductive region and the conductive barrier film.
申请公布号 US2017103948(A1) 申请公布日期 2017.04.13
申请号 US201615186825 申请日期 2016.06.20
申请人 Samsung Electronics Co., Ltd. 发明人 LEE Do-sun;LEE Do-hyun;KIM Chul-sung;HYUN Sang-jin;LEE Joon-gon
分类号 H01L23/535;H01L27/088;H01L29/06;H01L29/78;H01L29/417 主分类号 H01L23/535
代理机构 代理人
主权项 1. An integrated circuit device comprising: a substrate having at least one fin-shaped active region, the at least one fin-shaped active region extending in a first direction; a gate line extending on the at least one fin-shaped active region in a second direction, the second direction intersecting with the first direction; a conductive region on a portion of the at least one fin-shaped active region at one side of the gate line; and a contact plug extending from the conductive region in a third direction, the third direction being perpendicular to a main plane of the substrate, the contact plug including, a metal plug,a conductive barrier film on the conductive region, the conductive barrier film surrounding a sidewall and a bottom surface of the metal plug, the conductive barrier film including an N-rich metal nitride film, anda metal silicide film between the conductive region and the conductive barrier film.
地址 Suwon-si KR