TEST APPARATUS, TEST SIGNAL SUPPLY APPARATUS, TEST METHOD, AND COMPUTER READABLE MEDIUM

摘要

To reduce test costs by reducing the number of pattern generators provided to a test apparatus. A test apparatus that tests a device under test and a test method are provided, the test apparatus comprising: a packet transmitting unit that packetizes and transmits, during a test of the device under test, a test pattern to be supplied to the device under test; a packet transferring unit that transfers a packet transmitted by the packet transmitting unit; a packet receiving unit that receives the test pattern transferred via the packet transferring unit; a buffering unit that buffers the test pattern received by the packet receiving unit; and a test signal supply unit that supplies the device under test with a test signal according to the test pattern acquired from the buffering unit.

主权项

1. A test apparatus that tests a device under test, the test apparatus comprising:
a packet transmitting unit that packetizes and transmits, during a test of the device under test, a test pattern to be supplied to the device under test; a packet transferring unit that transfers a packet transmitted by the packet transmitting unit; a packet receiving unit that receives the test pattern transferred via the packet transferring unit; a buffering unit that buffers the test pattern received by the packet receiving unit; and a test signal supply unit that supplies the device under test with a test signal according to the test pattern acquired from the buffering unit.