Controlling automated testing of devices

摘要

In an embodiment, a method includes causing a test floor system to insert a DUT (device under test) into a DUT receptacle. This is performed in a manner that couples the DUT to an electrical interface of the DUT receptacle and that encloses the DUT inside the DUT receptacle to facilitate testing of the DUT. Also, the method includes causing the test floor system to transport the DUT receptacle that encloses the DUT to a tester of the test floor system and to insert the DUT receptacle into a DUT testing module of the tester. Further, the method includes causing the test floor system to determine identification information of the DUT. Furthermore, the method includes, based on the identification information, sending a test routine to the DUT testing module to perform on the DUT.

主权项

1. A method, comprising:
causing a test floor system to insert a DUT (device under test) into a DUT receptacle in a manner that couples the DUT to an electrical interface of the DUT receptacle and that encloses the DUT inside the DUT receptacle to facilitate testing of the DUT; causing the test floor system to transport the DUT receptacle that encloses the DUT to a tester of the test floor system and to insert the DUT receptacle into a DUT testing module of the tester, wherein the DUT testing module includes a first air hose operable to deliver an air flow into the DUT receptacle and a second air hose operable to carry out an interior air flow from inside the DUT receptacle; causing the test floor system to determine identification information of the DUT; and based on the identification information, sending a test routine to the DUT testing module to perform on the DUT.